Specializing in Piezo Stages and Nanopositioning Solutions

How Piezo Stages React to Temperature Variation

Qualitative analysis Flexure-based piezo stages are essentially blocks of metal with flexure patterns that create a moving platform suspended from static frame via flexures. The sketch below shows a simplified flexure stage that moves in one direction when the piezo expands or contracts. A capacitive sensor is used as the feedback sensor and a preload […]

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Piezo Stage Load vs. Settling Time

To maximize the capabilities of piezo stages, it is important to understand how different factors contribute to the performance of the system. For many applications, the resonant frequency and settling time of a stage are of primary interest. In this blogpost we explore how the resonant frequency and settling time are affected by the load […]

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High Resolution Data Acquisition for Piezo Stages

In order to maximize scanning speed for photonics applications, it is often important to acquire recordings of nanopositoning stage sensor data synchronized with data collected from external sensors or detectors.  The LC.400 series of controllers can record up to 8 streams of internal data simultaneously, including voltage signals measured via the controller front panel BNC analog […]

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Raster Scanning Techniques for Photonics Applications

The nPoint LC.400 series of controllers have several internal functions for use with raster scanning.  A traditional raster scan can be generated via the simple Raster Scanning GUI used in the traditional raster scan below. Additional raster scanning patterns can be generated via the arbitrary scan capability of the controller. This provides complete flexibility for […]

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Orthogonality Correction for Piezo Flexure Stages

nPoint is now offering an easy way for correcting the orthogonality error of XY scanners for the most demanding scanning applications. This capability is primarily used by OEM customers in applications such as Atomic Force Microscopy (AFM). An external method for measuring the orthogonality error is necessary prior to applying such correction. The AFM application […]

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