Specializing in Piezo Stages and Nanopositioning Solutions

How Piezo Stages React to Temperature Variation

Qualitative analysis Flexure-based piezo stages are essentially blocks of metal with flexure patterns that create a moving platform suspended from static frame via flexures. The sketch below shows a simplified flexure stage that moves in one direction when the piezo expands or contracts. A capacitive sensor is used as the feedback sensor and a preload […]

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Piezo Stage Load vs. Settling Time

To maximize the capabilities of piezo stages, it is important to understand how different factors contribute to the performance of the system. For many applications, the resonant frequency and settling time of a stage are of primary interest. In this blogpost we explore how the resonant frequency and settling time are affected by the load […]

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Fundamentals of piezo stage design: range of motion, footprint and stiffness

Piezo stages are used in applications where high precision in motion, very fast movements (in milliseconds), or high force generation out of a small volume (kilo Newton) are necessary. High precision in motion is required in Atomic Force Microscopy, for example. TappingMode™ image of indentation patterns on Parafilm® acquired with a MultiMode® AFM and an […]

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How to care for your nPoint products

A benefit of choosing an nPoint flexure-based nanopositioning system is that it requires minimal maintenance throughout its lifetime. Flexure-based designs are zero friction with no mechanical wear, thus routine maintenance is virtually eliminated. However, users should still consider a few important points to ensure that their stages and controllers perform optimally. The lifetime of nPoint stages […]

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Orthogonality Correction for Piezo Flexure Stages

nPoint is now offering an easy way for correcting the orthogonality error of XY scanners for the most demanding scanning applications. This capability is primarily used by OEM customers in applications such as Atomic Force Microscopy (AFM). An external method for measuring the orthogonality error is necessary prior to applying such correction. The AFM application […]

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