Information and Resources
Selecting a standard or designing custom nanopositioning systems requires understanding how individual parameters and design constraints contribute to the product's performance. nPoint, Inc. is dedicated to helping our customers navigate the nanopositioner selection process. Our information page contains basic terminology as well as answers to frequently asked questions. Please contact us with additional questions.
Frequently Asked Questions
Have a question? It's often the case that someone else has had the same one. Here you'll find frequently asked questions relating to our nanopositioning systems.
Glossary
The field of nanotechnology is quite complex, and so are some of the terms. Check out the glossary if you're new to these terms.
Articles and White Papers
- The Scanned-Probe Microscope As a Nano-Metrology Tool - APS Presentation
- Solid State Technology, Microlithography World, August 2004: Stylus Nanoprofilometry for Mask Metrology
- Nanopositioning Tools and Techniques for R&D Applications
- Sharpened Carbon Nanotube Probes
- Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes