Piezo Stage Orthogonality

Orthogonality Correction for Piezo Flexure Stages

nPoint is now offering an easy way for correcting the orthogonality error of XY scanners for the most demanding scanning applications. This capability is primarily used by OEM customers in applications such as Atomic Force Microscopy (AFM). An external method for measuring the orthogonality error is necessary prior to applying such correction. The AFM application […]

Resonant frequency

The first (or the lowest) resonant frequency of a nanopositioner. The resonant frequency could be of the mode along the motion axis or in other axes including rotation and other complex modes. In general, the higher the resonant frequency of a system, the higher the stability and the wider working bandwidth the system will have. […]