3D Spiral Scan Plot

High Resolution Data Acquisition for Piezo Stages

In order to maximize scanning speed for photonics applications, it is often important to acquire recordings of nanopositoning stage sensor data synchronized with data collected from external sensors or detectors.  The LC.400 series of controllers can record up to 8 streams of internal data simultaneously, including voltage signals measured via the controller front panel BNC analog […]

Piezo Stage Orthogonality

Orthogonality Correction for Piezo Flexure Stages

nPoint is now offering an easy way for correcting the orthogonality error of XY scanners for the most demanding scanning applications. This capability is primarily used by OEM customers in applications such as Atomic Force Microscopy (AFM). An external method for measuring the orthogonality error is necessary prior to applying such correction. The AFM application […]