Nanopositioning Stages

nPoint specializes in piezo-driven flexure-guided nanopositioners and motion control tools that can be used in various environments, including ultra-high vacuum and military-spec. The use of capacitive feedback ensures outstanding motion linearity and position accuracy while the nPoint 400 series DSP controllers provide flexibility in optimizing the response of the nanopositioner in a variety of applications. nPoint's piezo stages provide X, Z, XY, XYZ and tip-tilt nanomotion control. Our nanopositioning systems are designed for motion critical applications including: nanolithography, atomic force microscopy (AFM), biophysics, and optical focusing.

Our piezo flexure stages provide up to 600µm of scanning and position control and 14 mradians in tip-tilt applications. The closed-loop feedback mechanism provides unequaled precision and accuracy. Our unique flexure-guided designs ensure high resonant frequencies while minimizing orthogonality and cross-talk effects. nPoint's piezo stages, coupled with our DSP electronic controls, provide users with the ultimate nanopositioning systems.

Standard stage materials are listed. Other materials including invar, super invar, stainless steel, titanium, and aluminum are available for some stages. UHV configurations are also available in most products. Please inquire if interested in these features.

	NPXY10-263 P/N: 3715263 UHV compatible, compact, fast, ultra-precise stage.	XY: 10µm
	NPXY30-148 P/N: 3715148 Ultra-fast, direct-drive XY stage developed for metrology applications.	XY: 30µm
	NPXY80-253 P/N: 3715253 Compact, XY stage developed for AFM applications.	XY: 80µm
	NPXY100-100 P/N: 3715100 Ultra-precise XY stage developed for metrology applications.	XY: 100µm
	NPXY100-114 P/N: 3715114 Ultra-fast XY stage developed for metrology applications.	XY: 100µm
	NPXY100-126 P/N: 3715126 Low-profile, large aperture XY stage developed for microscopy applications.	XY: 100µm
	NPXY100-216 P/N: 3715216 Low-profile, very large aperture XY stage developed for microscopy applications.	XY: 100µm
	NPXY150-131 P/N: 3715131 Low-profile, large aperture XY stage developed for microscopy applications.	XY: 150µm
	NPXY200-101 P/N: 3715101 Ultra-precise XY stage developed for metrology applications.	XY: 200µm
	NPXY200-208 P/N: 3715208 Ultra-precise, large aperture XY stage made of Super Invar.	XY: 200µm
	NPXY400-132 P/N: 3714132 Large-range XY stage developed for AFM applications. It integrates easily with optical microscopes.	XY: 400µm

	nPCube P/N: 3715247 Compact XYZ stage with 100µm range.	XYZ: 100µm
	nPBio100 P/N: 3715231-100 XYZ piezo stage developed for easy integration with inverted microscopes. It is part of the nPBio product line.	XYZ: 100µm
	nPBio200 P/N: 3715231-200 XYZ piezo stage developed for easy integration with inverted microscopes. It is part of the nPBio product line.	XYZ: 200µm
	nPBio300 P/N: 3715231-300 XYZ piezo stage developed for easy integration with inverted microscopes. It is part of the nPBio product line.	XYZ: 300µm
	NPXY10Z5-187 P/N: 3715187 UHV compatible, high-speed AFM scanner	XY: 10µm Z: 5µm
	NPXY50Z50-204 P/N: 3715204 High-speed, large aperture XYZ stage developed for easy integration with inverted microscopes.	XYZ: 50µm
	NPXY80Z5-259 P/N: 3715259 Compact AFM scanner.	XY: 80µm Z: 5µm
	NPXY100Z10-128 P/N: 3715128 Large aperture XYZ stage developed for scanning probe and optical microscopy applications.	XY: 100µm Z: 10µm
	NPXY100Z15-163 P/N: 3715163 Ultra-precise XYZ stage developed for metrology applications and easy integration with Dimension AFMs.	XY: 100µm Z: 15µm
	NPXY100Z25-264 P/N: 3715264 Large aperture XYZ stage developed for scanning probe and optical microscopy applications.	XY: 100µm Z: 25µm
	NPXY100Z25-102 P/N: 3715102 Ultra-precise XYZ stage developed for metrology applications.	XY: 100µm Z: 25µm
	NPXY100Z25-219 P/N: 3715219 Non-magnetic XYZ stage.	XY: 100µm Z: 25µm
	NPXY100Z50-244 P/N: 3715244 Large aperture XYZ stage developed for scanning probe and optical microscopy applications.	XY: 100µm Z: 50µm
	NPXY100Z100-135 P/N: 3715135 Large aperture XYZ stage developed for scanning probe and optical microscopy applications.	XYZ: 100µm
	NPXY150Z10-143 P/N: 3715143 Large aperture XYZ stage developed for scanning probe and optical microscopy applications.	XY: 150µm Z: 10µm
	NPXY150Z25-265 P/N: 3715265 Large aperture XYZ stage developed for scanning probe and optical microscopy applications.	XY: 150µm Z: 25µm
	NPXY150Z50-266 P/N: 3715266 Large aperture XYZ stage developed for scanning probe and optical microscopy applications.	XY: 150µm Z: 200µm
	NPXY150Z100-267 P/N: 3715267 Large aperture XYZ stage developed for scanning probe and optical microscopy applications.	XY: 150µm Z: 100µm
	NPXY200Z10-269 P/N: 3715269 Large aperture XYZ stage developed for scanning probe and optical microscopy applications.	XY: 200µm Z: 10µm
	NPZ200Z15-268 P/N: 3715268 Ultra-precise XYZ stage developed for metrology applications and easy integration with Dimension AFMs.	XY: 200µm Z: 15µm
	NPXY200Z25-260 P/N: 3715260 Large aperture XYZ stage developed for scanning probe and optical microscopy applications.	XY: 200µm Z: 25µm
	NPXY200Z25-103 P/N: 3715103 Ultra-precise XYZ stage developed for metrology applications.	XY: 200µm Z: 25µm
	NPXY200Z50-270 P/N: 3715270 Large aperture XYZ piezo stage developed for scanning probe and optical microscopy applications.	XY: 200µm Z: 50µm
	NPXY200Z100-271 P/N: 3715271 Large aperture XYZ stage developed for scanning probe and optical microscopy applications.	XY: 200µm Z: 100µm
	NPXY400Z100-117 P/N: 3715117 Large range piezo stage developed for metrology applications and easy integration with Dimension AFMs.	XY: 400µm Z: 100µm