Piezo stages are used in applications where high precision in motion, very fast movements (in milliseconds), or high force generation out of a small volume (kilo Newton) are necessary. High precision in motion is required in Atomic Force Microscopy, for example. TappingMode™ image of indentation patterns on Parafilm® acquired with a MultiMode® AFM and an […]
A benefit of choosing an nPoint flexure-based nanopositioning system is that it requires minimal maintenance throughout its lifetime. Flexure-based designs are zero friction with no mechanical wear, thus routine maintenance is virtually eliminated. However, users should still consider a few important points to ensure that their stages and controllers perform optimally. The lifetime of nPoint stages […]
nPoint is now offering an easy way for correcting the orthogonality error of XY scanners for the most demanding scanning applications. This capability is primarily used by OEM customers in applications such as Atomic Force Microscopy (AFM). An external method for measuring the orthogonality error is necessary prior to applying such correction. The AFM application […]
Accurate tip-tilt nanopositioning piezo stage, designed for larger mirrors 2″ and above.
Ultra-fast objective nanopositioner. High stiffness allows for use with heavy microscope objectives.
Flexible, economical XY nanopositioning piezo stage. Standard aperture allows for integration in various optics and microscopy applications.
Fast Z nanopositioning piezo stage that can be configured for microscope objectives. High stiffness allows faster scanning with heavier loads.
A non-magnetic, UHV compatible, XYZ nanopositioning piezo stage. Very fast and precise, includes a small footprint and versatile aperture.
A non-magnetic, UHV compatible, XY nanopositioning piezo stage. Very fast and precise, includes a small footprint and versatile aperture.
Low-profile, high-speed, large aperture XY nanopositioning piezo stage developed for microscopy applications