Fundamentals of piezo stage design: range of motion, footprint and stiffness

Piezo stages are used in applications where high precision in motion, very fast movements (in milliseconds), or high force generation out of a small volume (kilo Newton) are necessary. High precision in motion is required in Atomic Force Microscopy, for example. TappingMode™ image of indentation patterns on Parafilm® acquired with a MultiMode® AFM and an […]

How to care for your nPoint products

A benefit of choosing an nPoint flexure-based nanopositioning system is that it requires minimal maintenance throughout its lifetime. Flexure-based designs are zero friction with no mechanical wear, thus routine maintenance is virtually eliminated. However, users should still consider a few important points to ensure that their stages and controllers perform optimally. The lifetime of nPoint stages […]

3D Spiral Scan Plot

High Resolution Data Acquisition for Piezo Stages

In order to maximize scanning speed for photonics applications, it is often important to acquire recordings of nanopositoning stage sensor data synchronized with data collected from external sensors or detectors.  The LC.400 series of controllers can record up to 8 streams of internal data simultaneously, including voltage signals measured via the controller front panel BNC analog […]

Raster Scanning Spiral Pattern

Raster Scanning Techniques for Photonics Applications

The nPoint LC.400 series of controllers have several internal functions for use with raster scanning.  A traditional raster scan can be generated via the simple Raster Scanning GUI used in the traditional raster scan below. Additional raster scanning patterns can be generated via the arbitrary scan capability of the controller. This provides complete flexibility for […]

Piezo Stage Orthogonality

Orthogonality Correction for Piezo Flexure Stages

nPoint is now offering an easy way for correcting the orthogonality error of XY scanners for the most demanding scanning applications. This capability is primarily used by OEM customers in applications such as Atomic Force Microscopy (AFM). An external method for measuring the orthogonality error is necessary prior to applying such correction. The AFM application […]

What is Phase Lag and How to Measure It

Understanding phase lag is important when scanning at high speeds with piezo flexure stages. This article describes the phase relationship between the command signal and the stage response. The response is monitored using the internal (in this case capacitive) sensor. The bandwidth of a system is the key element to phase lag. Using control parameters […]

RXY3-410 Nanopositioning Piezo Stage

Tip Tilt Piezo Stage Mirror Mounting

A tip tilt piezo stage provides the opportunity to dynamically scan a mirror with extreme precision and control. Piezo mirrors are used for laser beam steering and image stabilization applications. There are a variety of options built into nPoint systems for mounting purposes. Below are only a few suggestions, as custom mounting platforms and stages […]